Focused ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences

Sezen, Meltem (2016) Focused ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. In: Janeček, Miloš and Kral, Robert, (eds.) Modern Electron Microscopy in Physical and Life Sciences. InTech, Rijeka, Croatia. ISBN 978-953-51-2252-4

This is the latest version of this item.

Full text not available from this repository. (Request a copy)
Item Type: Book Section / Chapter
Subjects: Q Science > Q Science (General)
T Technology > T Technology (General)
Q Science > QC Physics > QC176-176.9 Solids. Solid state physics
Divisions: Faculty of Engineering and Natural Sciences > Academic programs > Materials Science & Eng.
Sabancı University Nanotechnology Research and Application Center
Faculty of Engineering and Natural Sciences > Basic Sciences > Physics
Faculty of Engineering and Natural Sciences
Depositing User: Meltem Sezen
Date Deposited: 23 Feb 2016 14:48
Last Modified: 23 Aug 2019 16:04
URI: https://research.sabanciuniv.edu/id/eprint/29165

Available Versions of this Item

Actions (login required)

View Item
View Item