Sezen, Meltem (2016) Focused ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. In: Janeček, Miloš and Kral, Robert, (eds.) Modern Electron Microscopy in Physical and Life Sciences. InTech, Rijeka, Croatia. ISBN 978-953-51-2252-4
This is the latest version of this item.
Official URL: http://dx.doi.org/10.5772/61634
| Item Type: | Book Section / Chapter |
|---|---|
| Subjects: | Q Science > Q Science (General) T Technology > T Technology (General) Q Science > QC Physics > QC176-176.9 Solids. Solid state physics |
| Divisions: | Faculty of Engineering and Natural Sciences > Academic programs > Materials Science & Eng. Sabancı University Nanotechnology Research and Application Center Faculty of Engineering and Natural Sciences > Basic Sciences > Physics Faculty of Engineering and Natural Sciences |
| Depositing User: | Meltem Sezen |
| Date Deposited: | 23 Feb 2016 14:48 |
| Last Modified: | 23 Aug 2019 16:04 |
| URI: | https://research.sabanciuniv.edu/id/eprint/29165 |
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Ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. (deposited 24 Dec 2015 12:06)
- Focused ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. (deposited 23 Feb 2016 14:48) [Currently Displayed]
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