Sezen, Meltem (2015) Ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. In: Janeček, Miloš, (ed.) Electron Microscopy. InTech, Rijeka, Croatia. ISBN 978-953-51-4599-8 (Accepted/In Press)
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| Item Type: | Book Section / Chapter |
|---|---|
| Subjects: | Q Science > Q Science (General) T Technology > T Technology (General) Q Science > QC Physics > QC176-176.9 Solids. Solid state physics |
| Divisions: | Faculty of Engineering and Natural Sciences > Academic programs > Materials Science & Eng. Sabancı University Nanotechnology Research and Application Center Faculty of Engineering and Natural Sciences > Basic Sciences > Physics Faculty of Engineering and Natural Sciences |
| Depositing User: | Meltem Sezen |
| Date Deposited: | 24 Dec 2015 12:06 |
| Last Modified: | 23 Aug 2019 15:50 |
| URI: | https://research.sabanciuniv.edu/id/eprint/29014 |
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- Ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. (deposited 24 Dec 2015 12:06) [Currently Displayed]
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