Sezer, Osman Gökhan and Ertüzün, Ayşın and Erçil, Aytül (2004) Independent component analysis for texture defect detection. Pattern Recognition and Image Analysis, 14 (2). pp. 303-307. ISSN 1054-6618
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Abstract
In this paper, a novel method for texture defect detection is presented. The method makes use of Independent Component Analysis (ICA) for feature extraction from the nonoverlapping subwindows of texture images and classifies a subwindow as defective or nondefective according to Euclidean distance between the feature obtained from average value of the features of a defect free sample and the feature obtained from one subwindow of a test image. The experimental results demonstrating the use of this method for visual inspection of textile products obtained from a real factory environment are also presented.
Item Type: | Article |
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Subjects: | T Technology > T Technology (General) |
Divisions: | Faculty of Engineering and Natural Sciences |
Depositing User: | Aytül Erçil |
Date Deposited: | 17 Feb 2007 02:00 |
Last Modified: | 26 Apr 2022 08:07 |
URI: | https://research.sabanciuniv.edu/id/eprint/392 |