Advanced focused ion beam nanostructuring of energy materials for TEM analysis and electron tomography

Official URL: http://www.empa.ch/plugin/template/empa/*/131463

The shrinkage in the dimensions of the novel materials, structures and systems down to atomic scale as an output of nanotechnology has assigned “Electron Microscopy” as the inseparable part of this field. In particular, tomography applications are recently becoming more popular for imaging of three dimensional energy materials such as, solid oxide fuel cells, hydrogen storage materials and solar cells. Especially, in order to reveal the geometric and elemental distribution of material systems that are based on nanostructures, advanced TEM and FIB imaging and tomography applications are being widely used. For this reason, ion milling based specific samples preparation techniques that keep the original structures of the sections to be investigated at the TEM are often required. Dual-beam technologies, which are becoming more popular everyday for its applications on diverse fields of science, provide material dependent and TEM analysis spectrum based solutions that are highly rapid, practical, creative and reliable.