Items where Author is "Trusch, Andreas"
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Papers in Conference Proceedings
Cao, Zhibo and Göritz, Alexander and Wietstruck, Matthias and Wipf, Selin Tolunay and Trusch, Andreas and Kaynak, Mehmet (2019) Finite-element modelling of stress induced wafer warpage for a full BiCMOS process. In: IEEE 19th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF), Orlando, FL, USA