Crossover of spectral reflectance lineshapes in Ge-doped VO2 thin films

Ertaş Uslu, Merve and Mısırlıoğlu, Burç and Şendur, Kürşat (2020) Crossover of spectral reflectance lineshapes in Ge-doped VO2 thin films. Optical Materials, 104 . ISSN 0925-3467 (Print) 1873-1252 (Online)

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Abstract

Adjusting the insulator-to-metal transition (IMT) temperature of vanadium dioxide (VO2) thin films for use in optical applications can be achieved via doping with various elements. An important aspect, which was largely overlooked in the literature, is the change in the spectral reflectivity lineshapes upon dopant addition in order to control the critical temperature TC of VO2. Here, we demonstrate that the TC in VO2 can be varied effectively with Ge doping. Moreover, we observe that the spectral lineshapes of the Ge doped VO2 films reveal rather interesting characteristics, such as a distinct crossover in the high-reflection and low-reflection regions during the IMT that could allow frequency specific spectral functionalities.
Item Type: Article
Divisions: Integrated Manufacturing Technologies Research and Application Center
Faculty of Engineering and Natural Sciences > Academic programs > Mechatronics
Sabancı University Nanotechnology Research and Application Center
Faculty of Engineering and Natural Sciences
Depositing User: Kürşat Şendur
Date Deposited: 27 May 2020 15:55
Last Modified: 30 Jul 2023 16:44
URI: https://research.sabanciuniv.edu/id/eprint/39912

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