Surface roughness effects on the broadband reflection for refractory metals and polar dielectrics

Official URL: http://dx.doi.org/10.3390/ma12193090

Random surface roughness and surface distortions occur inevitably because of various material processing and fabrication techniques. Tailoring and smoothing the surface roughness can be especially challenging for thermomechanically stable materials, including refractory metals, such as tungsten (W), and polar dielectrics, such as silicon carbide (SiC). The spectral reflectivity and emissivity of surfaces are significantly impacted by surface roughness effects. In this paper, we numerically investigated the surface roughness effects on the spectral reflectivity and emissivity of thermomechanically stable materials. Based on our results, we determined that surface roughness effects are strongly impacted by the correlation length of the Gaussian surface. In addition, our results indicate that surface roughness effects are stronger for the materials at the epsilon-near-zero region. Surface roughness effects are stronger between the visible and infrared spectral region for W and around the wavelength of 12 mu m for SiC, where plasma frequency and polar resonance frequency are located.