Variable Temperature-Scanning Hall Probe Microscopy (VT-SHPM) with GaN/AlGaN Two-Dimensional Electron Gas (2DEG) Micro Hall Sensors in 4-400K range, Using Novel Quartz Tuning Fork AFM Feedback

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Oral, Ahmet (2008) Variable Temperature-Scanning Hall Probe Microscopy (VT-SHPM) with GaN/AlGaN Two-Dimensional Electron Gas (2DEG) Micro Hall Sensors in 4-400K range, Using Novel Quartz Tuning Fork AFM Feedback. (Accepted/In Press)

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Item Type:	Article
Subjects:	Q Science > QC Physics
Divisions:	Faculty of Engineering and Natural Sciences > Basic Sciences > Physics Faculty of Engineering and Natural Sciences
Depositing User:	Ahmet Oral
Date Deposited:	10 Nov 2008 15:39
Last Modified:	22 Jul 2019 09:50
URI:	https://research.sabanciuniv.edu/id/eprint/10429

Available Versions of this Item

Variable Temperature-Scanning Hall Probe Microscopy (VT-SHPM) with GaN/AlGaN Two-Dimensional Electron Gas (2DEG) Micro Hall Sensors in 4-400K range, Using Novel Quartz Tuning Fork AFM Feedback. (deposited 10 Nov 2008 15:39) [Currently Displayed]
- Variable Temperature-Scanning Hall Probe Microscopy (VT-SHPM) with GaN/AlGaN Two-Dimensional Electron Gas (2DEG) Micro Hall Sensors in 4.2-425K range, Using Novel Quartz Tuning Fork AFM Feedback. (deposited 10 Nov 2008 14:50)
  - Variable temperature-scanning hall probe microscopy with GaN/AlGaN two-dimensional electron gas (2DEG) micro hall sensors in 4.2-425K range using novel quartz tuning fork AFM feedback. (deposited 25 Dec 2008 10:29)

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