Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy

Oral, Ahmet (2008) Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy. (Accepted/In Press)

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Item Type:	Article
Subjects:	Q Science > QC Physics
Divisions:	Center for Individual and Academic Development Human Resources President's Office Research and Graduate Policies Faculty of Engineering and Natural Sciences
Depositing User:	Ahmet Oral
Date Deposited:	07 Nov 2008 16:22
Last Modified:	19 Jul 2019 16:04
URI:	https://research.sabanciuniv.edu/id/eprint/10167

Available Versions of this Item

• Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy. (deposited 07 Nov 2008 16:22) [Currently Displayed]
  • Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy. (deposited 10 Nov 2008 15:12)
    • Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy. (deposited 08 Apr 2009 10:25)

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