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Ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences

Sezen, Meltem (2015) Ion beams (FIB): novel methodologies and recent applications for multidisciplinary sciences. In: Janeček, Miloš, (ed.) Electron Microscopy. InTech, Rijeka, Croatia. ISBN 978-953-51-4599-8 (Accepted/In Press)

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Item Type:Book Section / Chapter
Subjects:Q Science > Q Science (General)
T Technology > T Technology (General)
Q Science > QC Physics > QC176-176.9 Solids. Solid state physics
ID Code:29014
Deposited By:Meltem Sezen
Deposited On:24 Dec 2015 12:06
Last Modified:23 Feb 2016 14:48

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