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Advanced focused ion beam nanostructuring of energy materials for TEM analysis and electron tomography

Sezen, Meltem and Plank, Harald and Uusimaki, Toni and Haas, Wernfried (2013) Advanced focused ion beam nanostructuring of energy materials for TEM analysis and electron tomography. In: 7th International Symposium Hydrogen and Energy, Stoos, Switzerland

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Official URL: http://www.empa.ch/plugin/template/empa/*/131463

Abstract

The shrinkage in the dimensions of the novel materials, structures and systems down to atomic scale as an output of nanotechnology has assigned “Electron Microscopy” as the inseparable part of this field. In particular, tomography applications are recently becoming more popular for imaging of three dimensional energy materials such as, solid oxide fuel cells, hydrogen storage materials and solar cells. Especially, in order to reveal the geometric and elemental distribution of material systems that are based on nanostructures, advanced TEM and FIB imaging and tomography applications are being widely used. For this reason, ion milling based specific samples preparation techniques that keep the original structures of the sections to be investigated at the TEM are often required. Dual-beam technologies, which are becoming more popular everyday for its applications on diverse fields of science, provide material dependent and TEM analysis spectrum based solutions that are highly rapid, practical, creative and reliable.

Item Type:Papers in Conference Proceedings
Subjects:T Technology > T Technology (General) > T174.7 Nanotechnology
ID Code:23145
Deposited By:Meltem Sezen
Deposited On:21 Jan 2014 09:52
Last Modified:14 Oct 2014 12:27

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