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FEM modeling of microbolometer structures

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Kaynak, Canan B. and Goeritz, A. and Yamamoto, Y. and Trusch, A. and Stocchi, M. and Wietstruck, M. and Ünal, Kadir Eren and Özdemir, Mehmet Bora and Özsoy, Yusuf and Gürbüz, Yaşar and Kaynak, Mehmet (2020) FEM modeling of microbolometer structures. In: MikroSystemTechnik 2019; Congress, Berlin, Germany

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Official URL: https://ieeexplore.ieee.org/document/9012798

Abstract

This paper presents different geometrical designs for microbolometer in order to analyze mechanical and thermal behavior of the device. The simulations are performed on amorphous silicon based microbolometers with a pixel size of 12 micrometer x 12 micrometer by using finite-element-method (FEM) solver, ANSYS(r). The design differences are basically the change of the arm's length of the microbolometer, namely, half-sided, one-sided, and two-sided. The arm structures are consisted of three layers; silicon nitride/titanium nitride/silicon nitride (Si3N4/TiN/Si3N4). The mechanical part of simulations consisted of implementing residual stresses that arise after the deposition on different microbolometer models. The output from the mechanical simulations is the determination of deformations for X-Y, and Z planes and the total stress. The thermal-electric modeling provides thermal conductance while transient thermal modeling is used for the thermal time constant extraction. The simulations prove the mechanical stability and performance which is in a good agreement with the fabricated different designs of microbolometer.

Item Type:Papers in Conference Proceedings
Subjects:UNSPECIFIED
ID Code:40242
Deposited By:Yaşar Gürbüz
Deposited On:17 Sep 2020 23:04
Last Modified:17 Sep 2020 23:04

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