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Stabilization and thickness dependence of depletion charge induced domains in ferroelectric nano capacitors

Mısırlıoğlu, Burç and Yıldız, Mehmet (2011) Stabilization and thickness dependence of depletion charge induced domains in ferroelectric nano capacitors. In: Joint Conference on IEEE International Symposium on Applications of Ferroelectrics (ISAF/PFM)/ International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Vancouver, Canada

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Abstract

We analyze the domain structures as well as the phase transition temperatures in films with depletion charges. Due to depletion charges, saw-tooth like domain structures can develop spanning the entire film thickness in films with perfect electrode screening, i.e., ideal electrodes if the film is above a critical thickness. Transition temperature in films with dead layers does not depend nearly at all on the depletion charge density unless it is very high (>10(26) ionized impurities/m(3)). Relatively thick films (>8 nm in this work) with dead layers that have very high depletion charge densities have transition temperatures similar to those with the same charge density but with ideal electrodes, making us conclude that thick films with high depletion charge densities will not feel the dead layer effects. The results are provided for (001) BaTiO(3) films grown on (001) SrTiO(3) substrates with pseudomorphic top and bottom metallic electrodes.

Item Type:Papers in Conference Proceedings
Uncontrolled Keywords:Ferroelectric films; depletion charge; electrostatics; phase transition; thermodynamic simulation
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK1-4661 Electrical engineering. Electronics Nuclear engineering
T Technology > TK Electrical engineering. Electronics Nuclear engineering > TK7800-8360 Electronics
T Technology > T Technology (General) > T174.7 Nanotechnology
ID Code:17467
Deposited By:Burç Mısırlıoğlu
Deposited On:18 Nov 2011 22:57
Last Modified:18 Nov 2011 22:57

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