Creator/Author/Editor: Altfeder, I. B.


Yi, W. and Kaya, İsmet İnönü and Altfeder, I. B. and Appelbaum, I. and Chen, D. M. and Narayanamurti, V. (2005) Dual-probe scanning tunneling microscope for study of nanoscale metal-semiconductor interfaces. Review of scientific instruments, 76 (6). ISSN 0034-6748

This list was generated on Wed Oct 19 05:17:25 2016 EEST.