title   
  

Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement

Atabak, Mehrdad and Ünverdi, Özhan and Özer, H. Özgür and Oral, Ahmet (2009) Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement. Applied Surface Science, 256 (5). pp. 1299-1303. ISSN 0169-4332

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Official URL: http://dx.doi.org/10.1016/j.apsusc.2009.10.026

Abstract

We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 x 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been observed to be 2.5 N/mat single atomic step, in contrast to 13 N/m at multi atomic step on Si(1 1 1) surface. We also carried out a series of lateral stiffness-distance spectroscopy. We observed lateral stiffness-distance curves exhibit sharp increase in the stiffness as the sample is approached towards the surface. We usually observed positive stiffness and sometimes going into slightly negative region.

Item Type:Article
Additional Information:Proceedings of the Symposium on Surface Science 2008 Festschrift in honor of Professor Şefik Süzer's 60th birthday
Uncontrolled Keywords:Non-contact lateral atomic force microscopy; Small oscillation amplitude; Lateral force gradient-distance spectroscopy
Subjects:Q Science > QD Chemistry > QD450-801 Physical and theoretical chemistry
T Technology > TA Engineering (General). Civil engineering (General) > TA401-492 Materials of engineering and construction. Mechanics of materials
ID Code:15031
Deposited By:Ahmet Oral
Deposited On:04 Nov 2010 16:37
Last Modified:25 May 2011 14:19

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