title

Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy

Oral, Ahmet (2008) Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy. (Accepted/In Press)

Warning

There is a more recent version of this item available.

[img]

Preview

PDF - Requires a PDF viewer such as GSview, Xpdf or Adobe Acrobat Reader
5Mb

Item Type:	Article
Subjects:	Q Science > QC Physics
ID Code:	10432
Deposited By:	Ahmet Oral
Deposited On:	10 Nov 2008 15:12
Last Modified:	08 Apr 2009 10:50

Available Versions of this Item

Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy. (deposited 07 Nov 2008 16:22)
- Non-Contact Lateral Force Gradient Measurement with Small Amplitude Off-Resonance Atomic Force Microscopy. (deposited 10 Nov 2008 15:12) [Currently Displayed]
  - Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy. (deposited 08 Apr 2009 10:25)

Repository Staff Only: item control page

Sabanci University Research Database is powered by EPrints 3.